Volume 4, No. 4, December 2016
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A Theoretical Interpretation of NEXAFS of a Deuterated Hexagonal Boron Nitride Thin Film

Kaveenga Rasika Koswattage 1, Iwao Shimoyama 2, Yuji Baba 2, Tetsuhiro Sekiguchi 2, and Kazumichi Nakagawa 3
1. Faculty of Applied Science, Sabaragamuwa University of Sri Lanka, P.O. Box 02, Belihuloya, Sri Lanka
2. Japan Atomic Energy Agency, Tokai-mura, Naka-gun, Ibaraki-ken 319-1195, Japan
3. Kobe University, Tsurukabuto 3-11, Nada-ku, Kobe 657-8501, Japan
Abstract: Near edge X-ray absorption fine structure (NEXAFS) spectroscopy was performed to study the atomic deuterium (hydrogen) adsorption behavior on hexagonal boron nitride (h-BN) epitaxial thin film as a model system to BN nanomaterial. In this research work the B and N K-edge NEXAFS spectra were analyzed by density functional theory calculations with model clusters in order to support NEXAFS experimental results as well as verify the cluster dependence of the calculation.
 
Key words: Boron nitride, Thin film, Deuterium (Hydrogen), NEXAFS, DV-Xα

Cite: Kaveenga Rasika Koswattage, Iwao Shimoyama, Yuji Baba, Tetsuhiro Sekiguchi,  Kazumichi Nakagawa, "A Theoretical Interpretation of NEXAFS of a Deuterated Hexagonal Boron Nitride Thin Film," International Journal of Materials Science and Engineering, Vol. 4, No. 4, pp. 179-184, December 2016. doi: 10.17706/ijmse.2016.4.4.179-184

General Information

ISSN: 2315-4527
Editor-in-Chief: Prof. Emeritus Dato' Dr. Muhammad Yahaya
DOI: 10.17706/ijmse
Abstracting/ Indexing: Ulrich's Periodicals Directory, Google Scholar, Crossref, Engineering & Technology Digital Library and Electronic Journals Digital Library
E-mail: ijmse@iap.org