Frequency Dependant Electrical Characterization of ZnO Thin Film on Aluminum Substrate prepared by Sol-gel Technique
Priyabrata Pattanaik1, Pratyus Pattnayak1, Chinmaya Behera1, Sushanta Kumar Kamilla1, and
Debi Prasad Das2
1. Semiconductor Research lab, Institute of Technical Education & Research (ITER), Siksha O Anusandhan University, Bhubaneswar, Odisha, India
2. Process Engineering and Instrumentation Cell, CSIR-Institute of Minerals and Materials Technology, Bhubaneswar, Odisha, India
2. Process Engineering and Instrumentation Cell, CSIR-Institute of Minerals and Materials Technology, Bhubaneswar, Odisha, India
Abstract—Zinc Oxide (ZnO) compound is a crystalline form of hexagonal wurtzite structure. Its unique chemical and physical properties such as wide band gap energy, high piezoelectric property, stable molecule absorption characteristics and optical catalyst functions are exploited for use in chemical sensor, industrial monitor, medical application and biosensor. In this present work the frequency response of sol-gel prepared ZnO coated on aluminum substrate are presented. The sample was detected as n-type by hot probe method. The frequency dependence electrical characterizations such as inductance, resistance, capacitance and impedance of the specimen were studied using LCR Meter. From this study we find that capacitance and impedance decreases with increase of frequency, but inductance and resistance are independent of frequency. In addition, the uniform coated morphology of oxide film on the substrate was observed by high resolution optical microscope.
Index Terms—P-type Zinc oxide, Zinc-coated aluminum, sol-gel Technique, LCR meter
Cite: Priyabrata Pattanaik, Pratyus Pattnayak, Chinmaya Behera, Sushanta Kumar Kamilla, and Debi Prasad Das, "Frequency Dependant Electrical Characterization of ZnO Thin Film on Aluminum Substrate prepared by Sol-gel Technique," International Journal of Materials Science and Engineering, Vol. 3, No. 1, pp. 86-89, March 2015. doi: 10.12720/ijmse.3.1.86-89
Index Terms—P-type Zinc oxide, Zinc-coated aluminum, sol-gel Technique, LCR meter
Cite: Priyabrata Pattanaik, Pratyus Pattnayak, Chinmaya Behera, Sushanta Kumar Kamilla, and Debi Prasad Das, "Frequency Dependant Electrical Characterization of ZnO Thin Film on Aluminum Substrate prepared by Sol-gel Technique," International Journal of Materials Science and Engineering, Vol. 3, No. 1, pp. 86-89, March 2015. doi: 10.12720/ijmse.3.1.86-89
General Information
ISSN: 2315-4527 (Print)
Abbreviated Title: Int. J. Mater. Sci. Eng.
Editor-in-Chief: Prof. Emeritus Dato' Dr. Muhammad Yahaya
DOI: 10.17706/ijmse
Abstracting/ Indexing: Ulrich's Periodicals Directory, Google Scholar, Crossref
E-mail: ijmse@iap.org
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