Growth, Microhardness, Electrical and Dielectric studies on L-Alanine Hydrogen Chloride NLO Single Crystal
Suresh Sagadevan 1 and
Priya Murugasen 2
1. Department of Physics, Sree Sastha Institute of Engineering and Technology, Chennai-600 123, India
2. Department of Physics, Saveetha Engineering College, Chennai-600123, India
2. Department of Physics, Saveetha Engineering College, Chennai-600123, India
Abstract: L-Alanine Hydrogen Chloride (LAHCL) single crystals were grown using slow evaporation technique. Single crystal X-ray diffraction analysis reveals that the crystal belongs to orthorhombic in structure with the space group P212121. The refractive index of the crystal was determined using Brewster’s angle method. Vicker’s microhardness measurements for different loads were carried out for grown single crystal. The dielectric studies show that the dielectric constant and dielectric loss decrease exponentially with frequency at different temperatures (30◦C, 60◦C, 90◦C and120◦C). The photoconductivity studies reveal that the crystal exhibits negative photoconductivity. The Kurtz powder test confirms that the SHG efficiency of L-alanine hydrogen chloride is equal to that of KDP. The growth pattern was analysed by etching studies.
Key words: single crystal, growth from solution, X-ray diffraction, dielectric constant and photoconductivity studies.
Cite:Suresh Sagadevan and Priya Murugasen, "Growth, Microhardness, Electrical and Dielectric studies on L-Alanine Hydrogen Chloride NLO Single Crystal," International Journal of Materials Science and Engineering, Vol. 3, No. 2, pp. 159-166, June 2015. doi: 10.17706/ijmse.2015.3.2.159-166
Key words: single crystal, growth from solution, X-ray diffraction, dielectric constant and photoconductivity studies.
Cite:Suresh Sagadevan and Priya Murugasen, "Growth, Microhardness, Electrical and Dielectric studies on L-Alanine Hydrogen Chloride NLO Single Crystal," International Journal of Materials Science and Engineering, Vol. 3, No. 2, pp. 159-166, June 2015. doi: 10.17706/ijmse.2015.3.2.159-166
General Information
ISSN: 2315-4527 (Print)
Abbreviated Title: Int. J. Mater. Sci. Eng.
Editor-in-Chief: Prof. Emeritus Dato' Dr. Muhammad Yahaya
DOI: 10.17706/ijmse
Abstracting/ Indexing: Ulrich's Periodicals Directory, Google Scholar, Crossref
E-mail: ijmse@iap.org
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